Scanning electron microscopy (SEM) is a valuable instrumental technique for surface imaging and characterization of materials.

The images are useful for studying:

• specimen morphology;
• structure; and/or
• particle size.

Energy-dispersive X-ray spectroscopy (EDX) is then used to determine the elemental composition of specimen.

FORAY uses a Philips XL30 Field Emission Scanning Electron Microscope and an Oxford Instruments Energy Dispersive Spectroscope to characterize and study a variety of materials:

SEM examples

Failures in metals, plastics, wood, ceramics and other materials.

Corrosion and corrosion products

Figure 1:  Electron image of the underside of a rust tubercle nodule showing the different structural forms present.

Inclusions in plastic

Figure 2: Back scattered electron image of inclusion in a PET film
 

Identification of biological matter

  

Figures 3 and 4: Secondary electron images on filter used for filtering water. Diatoms were identified through morphological appearance. Right image is higher magnification.
 

Figure 5: Chemical analysis of the overall area shown in Figures 3 and 4. Elements detected were carbon, oxygen, aluminium, silicon, iron and traces of chlorine and potassium. Note carbon, oxygen and silicon are indicative of diatoms

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